35 lines
1.4 KiB
Markdown
35 lines
1.4 KiB
Markdown
Unit test here relies on generated facet support.
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Also rehearsing subsystem setup that we use in other xo subsystems
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to perform facet registration.
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(This is for form's sake. Could just as well invoke directly from gc_utest_main.cpp).
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idl/ config for obj<AGCObjectVisitor,DMockCollector>.
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IGCObject_DMockCollector.*pp automatically generated from idl/
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MockCollector.hpp fop header file for DX1Collector.
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DMockCollector.*pp mock ACollector impl. Wraps a GCObjectStore pointer.
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Load-bearing for GCObjectStore.test.cpp
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init_gc_utest.*pp mock subsystem setup for this directory,
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as if it were an "xo-gc-utest" subsystem
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GCObjectStore.test.cpp Generative tests for GCObjectStore.
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Generate non-trivial object graphs,
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verify evacuation algorithm.
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----------------------------------------------------------------
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These don't use anything downstream of idl/
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Collector.test.cpp X1 tests. Does some random allocs,
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but doesn't exercise GC features
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X1Collector.test.cpp standalone X1Collector test.
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does some atomic allocs + verifies
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GC behavior for a few xo-object2/ types.
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Verify simple tests here.
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DX1CollectorIterator.test.cpp Collector iterator test
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